Jurriaan Schmitz
16Patents
8h-index
16Co-inventors
65Inventor score
Filing activity: Dec 13, 1996 → Apr 6, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6271551A | Si-Ge CMOS semiconductor device | Electricity | 267 | Expired |
| US6251729A | Method of manufacturing a nonvolatile memory | Electricity | 83 | Expired |
| US6177303A | Method of manufacturing a semiconductor device with a field effect transistor | Electricity | 53 | Expired |
| US6472706B2 | Semiconductor device | Electricity | 42 | Expired |
| US6743682B2 | Method of manufacturing a semiconductor device | Electricity | 29 | Expired |
| US6368915B1 | Method of manufacturing a semiconductor device | Electricity | 22 | Expired |
| US6403426B1 | Method of manufacturing a semiconductor device | Electricity | 12 | Expired |
| US6656760B2 | Solid state imaging sensor in a submicron technology and method of manufacturing and use of a solid state imaging sensor | Electricity | 10 | Expired |
| US6255183A | Manufacture of a semiconductor device with a MOS transistor having an LDD structure using SiGe spacers | Emerging Cross-Sectional Technologies | 8 | Expired |
| US6406963B2 | Method of manufacturing a semiconductor device | Electricity | 8 | Expired |
| US6476430B1 | Integrated circuit | Electricity | 7 | Expired |
| US8848194B2 | Integrated plasmonic nanocavity sensing device | Physics | 7 | Active |
| US6303453A | Method of manufacturing a semiconductor device comprising a MOS transistor | Electricity | 4 | Expired |
| US7262460B2 | Vertical insulated gate transistor and manufacturing method | Electricity | 2 | Expired |
| US7157349B2 | Method of manufacturing a semiconductor device with field isolation regions consisting of grooves filled with isolation material | Electricity | 0 | Expired |
| US6969645B2 | Method of manufacturing a semiconductor device comprising a non-volatile memory with memory cells | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.