Karsten Stoll
11Patents
4h-index
19Co-inventors
53Inventor score
Filing activity: Oct 2, 2003 → Oct 5, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8497693B2 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Physics | 8 | Active |
| US8240650B2 | Chuck with triaxial construction | Emerging Cross-Sectional Technologies | 6 | Active |
| US8278951B2 | Probe station for testing semiconductor substrates and comprising EMI shielding | Physics | 5 | Active |
| US7038441B2 | Test apparatus with loading device | Physics | 4 | Expired |
| US7999563B2 | Chuck for supporting and retaining a test substrate and a calibration substrate | Physics | 3 | Active |
| US7652491B2 | Probe support with shield for the examination of test substrates under use of probe supports | Physics | 3 | Active |
| US9784763B1 | Shielded probe systems with controlled testing environments | Physics | 2 | Active |
| US7265536B2 | Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station | Physics | 1 | Expired |
| US8680879B2 | Chuck for supporting and retaining a test substrate and a calibration substrate | Physics | 0 | Active |
| US10281492B2 | Shielded probe systems with controlled testing environments | Physics | 0 | Active |
| US9395411B2 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.