Inventor · Tokyo, JP

Kinya Goto

17Patents
4h-index
11Co-inventors
53Inventor score

Filing activity: Jul 26, 1999 → Dec 23, 2014

Most-cited inventions

PatentTitleAreaCited byStatus
US6734489B2 Semiconductor element and MIM-type capacitor formed in different layers of a semiconductor device Electricity 18 Expired
US7605448B2 Semiconductor device with seal ring Electricity 15 Expired
US6399424B1 Method of manufacturing contact structure Electricity 7 Expired
US8018030B2 Semiconductor chip with seal ring and sacrificial corner pattern Electricity 4 Active
US7208408B2 Method for fabricating a dual damascene contact in an insulating film having density gradually varying in the thickness direction Electricity 4 Expired
US6930394B2 Electronic device includes an insulating film having density or carbon concentration varying gradually in the direction of the thickness and a conductive film formed therein Electricity 3 Expired
US6222256A Semiconductor device and method of manufacturing the same Electricity 3 Expired
US8963291B2 Semiconductor chip with seal ring and sacrificial corner pattern Electricity 3 Active
US7602063B2 Semiconductor device and manufacturing method therefor Electricity 1 Expired
US7671473B2 Semiconductor device and method of fabricating the same Electricity 1 Active
US8390135B2 Semiconductor device Electricity 1 Active
US6737319B2 Method of manufacturing semiconductor device and semiconductor device Electricity 1 Expired
US6551921B2 Method of polishing a stack of dielectric layers including a fluorine containing silicon oxide layer Electricity 0 Expired
US7960279B2 Semiconductor device and manufacturing method therefor Electricity 0 Active
US7981790B2 Semiconductor device and method of fabricating the same Electricity 0 Active
US9368459B2 Semiconductor chip with seal ring and sacrificial corner pattern Electricity 0 Active
US6509648B1 Method of manufacturing semiconductor device and semiconductor device Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.