Ko-Bin Kao
21Patents
4h-index
51Co-inventors
62Inventor score
Filing activity: May 9, 2007 → Jun 26, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8728332B2 | Methods of patterning small via pitch dimensions | Electricity | 148 | Active |
| US9099530B2 | Methods of patterning small via pitch dimensions | Electricity | 101 | Active |
| US8563231B2 | Patterning process and materials for lithography | Physics | 4 | Active |
| US9613850B2 | Lithographic technique for feature cut by line-end shrink | Electricity | 4 | Active |
| US10388644B2 | Method of manufacturing conductors and semiconductor device which includes conductors | Electricity | 3 | Active |
| US9984876B2 | Lithographic technique for feature cut by line-end shrink | Electricity | 2 | Active |
| US11004709B2 | Method for monitoring gas in wafer processing system | Electricity | 1 | Active |
| US11688730B2 | Method and system of manufacturing conductors and semiconductor device which includes conductors | Electricity | 1 | Active |
| US10388523B2 | Lithographic technique for feature cut by line-end shrink | Electricity | 1 | Active |
| US11029603B2 | Chemical replacement system | Physics | 1 | Active |
| US10978439B2 | Method and system of manufacturing conductors and semiconductor device which includes conductors | Electricity | 1 | Active |
| US12025533B2 | System and method for liquid leak detection | Physics | 0 | Active |
| US11061333B2 | Manufacturing method of semiconductor device and semiconductor processing system | Electricity | 0 | Active |
| US11899368B2 | Manufacturing method of semiconductor device and semiconductor processing system | Electricity | 0 | Active |
| US11199466B2 | System and method for liquid leak detection | Physics | 0 | Active |
| US12278230B2 | Method of manufacturing conductors for semiconductor device | Electricity | 0 | Active |
| US10763113B2 | Lithographic technique for feature cut by line-end shrink | Electricity | 0 | Active |
| US11454891B2 | Manufacturing method of semiconductor device and semiconductor processing system | Electricity | 0 | Active |
| US8101340B2 | Method of inhibiting photoresist pattern collapse | Physics | 0 | Active |
| US9003336B2 | Mask assignment optimization | Electricity | 0 | Active |
| US10943802B2 | Photoresist bottle container | Mechanical Engineering; Lighting; Heating | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.