Mark S. Styduhar
19Patents
6h-index
39Co-inventors
66Inventor score
Filing activity: Oct 21, 1991 → Aug 22, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5396636A | Remote power control via data link | Physics | 86 | Expired |
| US7504847B2 | Mechanism for detection and compensation of NBTI induced threshold degradation | Physics | 8 | Active |
| US6549150B1 | Integrated test structure and method for verification of microelectronic devices | Electricity | 8 | Expired |
| US7696811B2 | Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Electricity | 6 | Active |
| US8839177B1 | Method and system allowing for semiconductor design rule optimization | Emerging Cross-Sectional Technologies | 6 | Active |
| US7459958B2 | Circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Electricity | 6 | Active |
| US7049857B2 | Asymmetric comparator for low power applications | Electricity | 4 | Expired |
| US7849426B2 | Mechanism for detection and compensation of NBTI induced threshold degradation | Physics | 3 | Active |
| US7821053B2 | Tunable capacitor | Electricity | 3 | Active |
| US9070791B2 | Tunable capacitor | Electricity | 2 | Active |
| US8799836B1 | Yield optimization for design library elements at library element level or at product level | Physics | 2 | Active |
| US7437620B2 | Method and system for extending the useful life of another system | Physics | 2 | Active |
| US7793163B2 | Method and system for extending the useful life of another system | Physics | 2 | Active |
| US7671666B2 | Methods to reduce threshold voltage tolerance and skew in multi-threshold voltage applications | Electricity | 1 | Active |
| US6894577B2 | Apparatus for providing power control to a real-time clock oscillator | Electricity | 1 | Expired |
| US8578314B1 | Circuit design with growable capacitor arrays | Physics | 0 | Active |
| US7089132B2 | Method and system for providing quality control on wafers running on a manufacturing line | Electricity | 0 | Expired |
| US7091743B2 | Data acknowledgment using impedance mismatching | Physics | 0 | Expired |
| US8010813B2 | Structure for system for extending the useful life of another system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.