Inventor · Aalen, DE

Michael Albiez

15Patents
4h-index
12Co-inventors
53Inventor score

Filing activity: Jun 8, 2007 → Oct 23, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US8450215B2 Particle beam systems and methods Electricity 6 Active
US9741528B2 Charged particle optical apparatus having a selectively positionable differential pressure module Electricity 5 Active
US10068744B2 Charged particle optical apparatus for through-the lens detection of particles Electricity 4 Active
US9354188B2 Particle beam device and method for operating a particle beam device Electricity 4 Active
US8064714B2 Method for binarizing a digital gray value image to generate a binarized gray value image and arrangement for carrying out said method Physics 2 Active
US8368020B2 Particle beam system Electricity 2 Active
US7888643B2 Focusing and positioning device for a particle-optical raster microscope Electricity 2 Active
US8481933B2 Method and device for examining a surface of an object Electricity 2 Active
US10522321B2 Charged particle optical apparatus for through-the-lens detection of particles Electricity 2 Active
US8368019B2 Particle beam system Electricity 1 Active
US11139140B2 Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatus Electricity 1 Active
US8131102B2 Method for processing a digital gray value image so that a reduced image noise and simultaneously a higher image sharpness is achieved Physics 1 Active
US8779381B2 Aperture unit for a particle beam device Electricity 0 Active
US11276547B2 Charged particle optical apparatus for through-the-lens detection of particles Electricity 0 Active
US10861670B2 Charged particle optical apparatus for through-the-lens detection of particles Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.