Inventor · Mountain View, CA, US

Michael I. Current

18Patents
7h-index
13Co-inventors
63Inventor score

Filing activity: Sep 28, 1990 → Apr 10, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5047648A Method and apparatus for detecting particles in ion implantation machines Electricity 32 Expired
US9704835B2 Three dimensional integrated circuit Electricity 28 Active
US5155369A Multiple angle implants for shallow implant Electricity 24 Expired
US7019513B1 Non-contact method and apparatus for measurement of sheet resistance and leakage current of p-n junctions Physics 16 Expired
US10049915B2 Three dimensional integrated circuit Electricity 15 Active
US10573627B2 Three dimensional integrated circuit Electricity 11 Active
US7414409B1 Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers Physics 11 Active
US11410984B1 Three dimensional integrated circuit with lateral connection layer Electricity 3 Active
US7642772B1 Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers Physics 3 Active
US8187377B2 Non-contact etch annealing of strained layers Electricity 3 Active
US10896823B2 Limited dose atomic layer processes for localizing coatings on non-planar surfaces Physics 2 Active
US10804252B2 Three dimensional integrated circuit Electricity 2 Active
US11901351B2 Three dimensional integrated circuit with lateral connection layer Electricity 0 Active
US10923459B2 Three dimensional integrated circuit Electricity 0 Active
USD645768S1 Junction photovoltage probe face General 0 Expired
US10923359B2 Limited dose and angle directed beam assisted ALE and ALD processes for localized coatings on non-planar surfaces Electricity 0 Active
US12176326B2 Method of forming semiconductor device using high stress cleave plane Electricity 0 Active
US11626392B2 Method of forming semiconductor device using range compensating material Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.