Inventor · Pulheim, DE

Moritz Andreas Meyer

11Patents
4h-index
15Co-inventors
53Inventor score

Filing activity: Oct 2, 2003 → Jan 29, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8329577B2 Method of forming an alloy in an interconnect structure to increase electromigration resistance Electricity 6 Active
US9281252B1 Method comprising applying an external mechanical stress to a semiconductor structure and semiconductor processing tool Electricity 5 Active
US7335880B2 Technique for CD measurement on the basis of area fraction determination Electricity 4 Active
US8039395B2 Technique for forming embedded metal lines having increased resistance against stress-induced material transport Electricity 4 Active
US6953755B2 Technique for monitoring the state of metal lines in microstructures Physics 3 Expired
US7718447B2 System and method for estimating the crystallinity of stacked metal lines in microstructures Physics 1 Active
US9898572B2 Metal line layout based on line shifting Physics 0 Active
US8058731B2 Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance Emerging Cross-Sectional Technologies 0 Active
US8058081B2 Method of testing an integrity of a material layer in a semiconductor structure Electricity 0 Active
US8575029B2 Technique for forming metal lines in a semiconductor by adapting the temperature dependence of the line resistance Emerging Cross-Sectional Technologies 0 Active
US12319900B2 Integral gas-introduction and stirring unit for gas-liquid reactors Chemistry; Metallurgy 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.