Inventor · Bellevue, WA, US

Robert Alan Hamm

17Patents
11h-index
16Co-inventors
69Inventor score

Filing activity: Aug 2, 1978 → Mar 10, 2000

Most-cited inventions

PatentTitleAreaCited byStatus
US6294018A Alignment techniques for epitaxial growth processes Electricity 284 Expired
US4331723A Advanced composite Emerging Cross-Sectional Technologies 104 Expired
US6317444A Optical device including carbon-doped contact layers Electricity 42 Expired
US4230293A Composite structure and method of making Emerging Cross-Sectional Technologies 31 Expired
US4452657A Composite integral web stiffening method Emerging Cross-Sectional Technologies 24 Expired
US4667905A High strength to weight horizontal and vertical aircraft stabilizer Performing Operations; Transporting 24 Expired
US5907165A INP heterostructure devices Electricity 18 Expired
US4278485A Method of forming composite wound structure Emerging Cross-Sectional Technologies 18 Expired
US6042975A Alignment techniques for photolithography utilizing multiple photoresist layers Electricity 17 Expired
US6156665A Trilayer lift-off process for semiconductor device metallization Electricity 15 Expired
US6139995A Method of manufacturing schottky gate transistor utilizing alignment techniques with multiple photoresist layers Electricity 13 Expired
US6855613B1 Method of fabricating a heterojunction bipolar transistor Electricity 10 Expired
US5932379A Repairing fractured wafers in semiconductor manufacturing Emerging Cross-Sectional Technologies 10 Expired
US4406633A Power take-off gearing for assembly at a marine vessel drive or propulsion system Performing Operations; Transporting 9 Expired
US4939102A Method of growing III-V semiconductor layers with high effective hole concentration Emerging Cross-Sectional Technologies 7 Expired
US6165859A Method for making InP heterostructure devices Electricity 5 Expired
US5773318A In-situ technique for cleaving crystals Emerging Cross-Sectional Technologies 5 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.