Ryouhei Kirisawa
75Patents
22h-index
39Co-inventors
88Inventor score
Filing activity: Nov 17, 1988 → Sep 12, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4959812A | Electrically erasable programmable read-only memory with NAND cell structure | Physics | 528 | Expired |
| US5602789A | Electrically erasable and programmable non-volatile and multi-level memory systemn with write-verify controller | Physics | 195 | Expired |
| US8178919B2 | Nonvolatile semiconductor memory device and method for manufacturing same | Electricity | 191 | Active |
| US8374033B2 | Nonvolatile semiconductor memory device | Electricity | 190 | Active |
| US5386422A | Electrically erasable and programmable non-volatile memory system with write-verify controller using two reference levels | Physics | 168 | Expired |
| US8507972B2 | Nonvolatile semiconductor memory device | Electricity | 158 | Active |
| US5469444A | Electrically erasable and programmable non-volatile memory system with write-verify controller using two reference levels | Physics | 140 | Expired |
| US5321699A | Electrically erasable and programmable non-volatile memory system with write-verify controller using two reference levels | Physics | 127 | Expired |
| US4939690A | Electrically erasable programmable read-only memory with NAND cell structure that suppresses memory cell threshold voltage variation | Physics | 109 | Expired |
| US5768195A | Semiconductor memory device | Electricity | 59 | Expired |
| US5293337A | Electrically erasable programmable read-only memory with electric field decreasing controller | Physics | 56 | Expired |
| US8169826B2 | Nonvolatile semiconductor memory device | Electricity | 53 | Active |
| USRE35838E | Electrically erasable programmable read-only memory with NAND cell structure | General | 52 | Expired |
| US8436414B2 | Non-volatile semiconductor stacked memory device having two semiconductor pillars in a through hole and method for manufacturing same | Electricity | 51 | Active |
| US5050125A | Electrically erasable programmable read-only memory with NAND cellstructure | Physics | 44 | Expired |
| US5508957A | Non-volatile semiconductor memory with NAND cell structure and switching transistors with different channel lengths to reduce punch-through | Electricity | 37 | Expired |
| US8199573B2 | Nonvolatile semiconductor memory device | Physics | 31 | Active |
| US5392238A | Nonvolatile semiconductor memory device | Physics | 30 | Expired |
| US8194467B2 | Nonvolatile semiconductor memory device | Electricity | 29 | Active |
| US8188530B2 | Nonvolatile semiconductor memory device and method for manufacturing same | Electricity | 28 | Active |
| US5528547A | Electrically erasable programmable read-only memory with electric field decreasing controller | Physics | 28 | Expired |
| US5402373A | Electrically erasable programmable read-only memory with electric field decreasing controller | Physics | 26 | Expired |
| US5515327A | Nonvolatile semiconductor memory device having a small number of internal boosting circuits | Physics | 21 | Expired |
| US5978265A | Non-volatile semiconductor memory device with nand type memory cell arrays | Physics | 20 | Expired |
| US5179427A | Non-volatile semiconductor memory device with voltage stabilizing electrode | Physics | 20 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.