Inventor · Aalen, DE

Stig Bieling

20Patents
2h-index
29Co-inventors
53Inventor score

Filing activity: Nov 18, 2010 → Jul 9, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US9046786B2 Illumination system of a microlithographic projection exposure apparatus Physics 4 Active
US8395754B2 Illumination optical unit for EUV microlithography Physics 3 Active
US9477157B2 Illumination system of a microlithographic projection exposure apparatus Physics 2 Active
US8294877B2 Illumination optical unit for projection lithography Physics 2 Active
US9983484B2 Illumination optical unit for EUV projection lithography Physics 2 Active
US11169445B2 Pupil facet mirror, optical system and illumination optics for a projection lithography system Physics 2 Active
US10146136B2 Reflecting coating with optimized thickness Physics 1 Active
US10599041B2 Facet mirror Physics 1 Active
US10018917B2 Illumination optical unit for EUV projection lithography Physics 1 Active
US9791784B2 Assembly for a projection exposure apparatus for EUV projection lithography Physics 1 Active
US10409167B2 Method for illuminating an object field of a projection exposure system Physics 0 Active
US8345219B2 Method and apparatus for setting an illumination optical unit Physics 0 Active
US9874819B2 Mirror array Physics 0 Active
US9983483B2 Illumination system of a microlithographic projection exposure apparatus Physics 0 Active
US10948828B2 Illumination optical element for projection lithography Physics 0 Active
US10394129B2 Microlithographic illumination unit Physics 0 Active
US11003086B2 Illumination optical device for projection lithography Physics 0 Active
US10324380B2 Projection exposure apparatus and method for measuring an imaging aberration Physics 0 Active
US10133182B2 Illumination optical assembly for a projection exposure apparatus Physics 0 Active
US9983482B2 Radiation collector, radiation source and lithographic apparatus Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.