Theodore Lundquist
24Patents
7h-index
39Co-inventors
69Inventor score
Filing activity: Dec 19, 1996 → Dec 23, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7786436B1 | FIB based open via analysis and repair | Electricity | 67 | Active |
| US7135678B2 | Charged particle guide | Electricity | 51 | Expired |
| US5905266A | Charged particle beam system with optical microscope | Electricity | 29 | Expired |
| US5840630A | FBI etching enhanced with 1,2 di-iodo-ethane | Electricity | 21 | Expired |
| US7135123B1 | Method and system for integrated circuit backside navigation | Electricity | 16 | Expired |
| US7842920B2 | Methods and systems of performing device failure analysis, electrical characterization and physical characterization | Physics | 11 | Active |
| US6943572B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 10 | Expired |
| US6848087B2 | Sub-resolution alignment of images | Physics | 7 | Expired |
| US7060196B2 | FIB milling of copper over organic dielectrics | Electricity | 7 | Expired |
| US7400154B2 | Apparatus and method for detecting photon emissions from transistors | Physics | 6 | Expired |
| US7530034B2 | Apparatus and method for circuit operation definition | Physics | 5 | Expired |
| US7115426B2 | Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate | Electricity | 4 | Expired |
| US7409653B2 | Sub-resolution alignment of images | Physics | 3 | Expired |
| US7884024B2 | Apparatus and method for optical interference fringe based integrated circuit processing | Electricity | 3 | Active |
| US7883630B2 | FIB milling of copper over organic dielectrics | Electricity | 3 | Active |
| US7439168B2 | Apparatus and method of forming silicide in a localized manner | Electricity | 2 | Expired |
| US6905623B2 | Precise, in-situ endpoint detection for charged particle beam processing | Electricity | 2 | Expired |
| US7036109B1 | Imaging integrated circuits with focused ion beam | Electricity | 1 | Expired |
| US6872581B2 | Measuring back-side voltage of an integrated circuit | Electricity | 1 | Expired |
| US10191111B2 | Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets | Physics | 1 | Active |
| US11114274B2 | Method and system for testing an integrated circuit | Electricity | 0 | Active |
| US7697146B2 | Apparatus and method for optical interference fringe based integrated circuit processing | Performing Operations; Transporting | 0 | Active |
| US10768224B2 | High frequency lock-in thermography using single photon detectors | Emerging Cross-Sectional Technologies | 0 | Active |
| US11047906B2 | Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.