Inventor · Portland, OR, US

Vinay Chikarmane

16Patents
5h-index
12Co-inventors
63Inventor score

Filing activity: Apr 25, 1997 → Dec 7, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US7719062B2 Tuned tensile stress low resistivity slot contact structure for n-type transistor performance enhancement Electricity 21 Active
US5804251A Low temperature aluminum alloy plug technology Electricity 16 Expired
US7070687B2 Apparatus and method of surface treatment for electrolytic and electroless plating of metals in integrated circuit manufacturing Electricity 13 Expired
US8120119B2 Stressed barrier plug slot contact structure for transistor performance enhancement Electricity 11 Active
US7968952B2 Stressed barrier plug slot contact structure for transistor performance enhancement Electricity 8 Active
US8278718B2 Stressed barrier plug slot contact structure for transistor performance enhancement Electricity 5 Active
US7525197B2 Barrier process/structure for transistor trench contact applications Electricity 3 Active
US10777655B2 Heterogeneous metal line compositions for advanced integrated circuit structure fabrication Electricity 3 Active
US7371311B2 Modified electroplating solution components in a low-acid electrolyte solution Chemistry; Metallurgy 3 Expired
US7001641B2 Seed layer treatment Emerging Cross-Sectional Technologies 1 Expired
US7768126B2 Barrier formation and structure to use in semiconductor devices Electricity 1 Active
US7741219B2 Method for manufacturing a semiconductor device using the self aligned contact (SAC) process flow for semiconductor devices with aluminum metal gates Electricity 1 Active
US11581419B2 Heterogeneous metal line compositions for advanced integrated circuit structure fabrication Electricity 1 Active
US10854731B2 Heterogeneous metal line compositions for advanced integrated circuit structure fabrication Electricity 1 Active
US11955534B2 Heterogeneous metal line compositions for advanced integrated circuit structure fabrication Electricity 0 Active
US7582558B2 Reducing corrosion in copper damascene processes Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.