Wei-Ming Hsiao
10Patents
2h-index
18Co-inventors
43Inventor score
Filing activity: Apr 9, 2015 → Nov 21, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9659937B2 | Semiconductor process of forming metal gates with different threshold voltages and semiconductor structure thereof | Electricity | 12 | Active |
| US10074725B1 | Semiconductor structure and manufacturing method thereof | Electricity | 3 | Active |
| US12211888B2 | Method for forming a thin film resistor with improved thermal stability | Electricity | 0 | Active |
| US10340350B2 | Semiconductor structure and manufacturing method thereof | Electricity | 0 | Active |
| US9691704B1 | Semiconductor structure and method for manufacturing the same | Electricity | 0 | Active |
| US11139384B2 | Method for fabricating semiconductor device | Electricity | 0 | Active |
| US12274087B2 | Field effect transistor and fabrication method thereof | Electricity | 0 | Active |
| US11165019B2 | ReRAM structure and method of fabricating the same | Electricity | 0 | Active |
| US10490643B2 | Semiconductor device and method for fabricating the same | Electricity | 0 | Active |
| US11424408B2 | ReRAM structure and method of fabricating the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.