Yasuhiro Kasama
24Patents
10h-index
48Co-inventors
75Inventor score
Filing activity: Jul 4, 1988 → Jan 9, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5332922A | Multi-chip semiconductor package | Electricity | 133 | Expired |
| US5208782A | Semiconductor integrated circuit device having a plurality of memory blocks and a lead on chip (LOC) arrangement | Electricity | 83 | Expired |
| US5701031A | Sealed stacked arrangement of semiconductor devices | Electricity | 39 | Expired |
| US5579256A | Semiconductor memory device and defect remedying method thereof | Emerging Cross-Sectional Technologies | 34 | Expired |
| US5602771A | Semiconductor memory device and defect remedying method thereof | Electricity | 27 | Expired |
| US5043947A | Semiconductor memory device | Physics | 19 | Expired |
| US4941129A | Semiconductor memory device | Physics | 16 | Expired |
| US6049500A | Semiconductor memory device and defect remedying method thereof | Electricity | 16 | Expired |
| US6515913B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 12 | Expired |
| US6160744A | Semiconductor memory device and defect remedying method thereof | Electricity | 11 | Expired |
| US6212089A | Semiconductor memory device and defect remedying method thereof | Electricity | 10 | Expired |
| US4956811A | Semiconductor memory | Physics | 8 | Expired |
| US5854508A | Semiconductor memory device having zigzag bonding pad arrangement | Emerging Cross-Sectional Technologies | 8 | Expired |
| US5268868A | Output buffer circuits for reducing ground bounce noise | Physics | 7 | Expired |
| US6657901B2 | Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit | Electricity | 6 | Expired |
| US6335884B1 | Semiconductor memory device and defect remedying method thereof | Electricity | 6 | Expired |
| USRE37539E1 | Sealed stacked arrangement of semiconductor devices | General | 6 | Expired |
| US6898130B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Expired |
| US5018101A | Semiconductor memory | Physics | 4 | Expired |
| US7499340B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Active |
| US7203101B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Expired |
| US5983358A | Semiconductor memory having redundancy circuit | Physics | 4 | Expired |
| US7345929B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 2 | Active |
| US7016236B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.