Inventor · Kuwana, JP

Yusuke Oshiki

17Patents
4h-index
20Co-inventors
56Inventor score

Filing activity: Jun 12, 2009 → Jul 3, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US9627401B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 6 Active
US9620366B2 Method for manufacturing semiconductor device Electricity 5 Active
US9754793B2 Method for manufacturing semiconductor device Electricity 5 Active
US10141329B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 4 Active
US10290595B2 Three-dimensional semiconductor memory device and method for manufacturing the same Electricity 3 Active
US10153164B2 Method for manufacturing semiconductor device Electricity 3 Active
US7902030B2 Manufacturing method for semiconductor device and semiconductor device Electricity 2 Active
US10535677B2 Semiconductor memory device and manufacturing method thereof Electricity 1 Active
US8383452B2 Semiconductor device and method for manufacturing the same Electricity 1 Active
US8377732B2 Method of manufacturing back side illuminated imaging device Electricity 1 Active
US10593694B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 1 Active
US12279432B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 0 Active
US8148717B2 Manufacturing method for semiconductor device and semiconductor device Electricity 0 Active
US11744074B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 0 Active
US8759205B2 Semiconductor device and method for manufacturing semiconductor device Electricity 0 Active
US11322513B2 Method for manufacturing semiconductor memory device and semiconductor memory device Electricity 0 Active
US12341102B2 Semiconductor storage device and manufacturing method thereof Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.