Ashok Kulkarni
40Patents
18h-index
75Co-inventors
84Inventor score
Filing activity: Nov 29, 1976 → Jul 6, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5991699A | Detecting groups of defects in semiconductor feature space | Electricity | 264 | Expired |
| US7676077B2 | Methods and systems for utilizing design data in combination with inspection data | Electricity | 208 | Active |
| US4183013A | System for extracting shape features from an image | Physics | 189 | Expired |
| US8126255B2 | Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions | Physics | 146 | Active |
| US6097887A | Software system and method for graphically building customized recipe flowcharts | Physics | 109 | Expired |
| US6233719A | System and method for analyzing semiconductor production data | Emerging Cross-Sectional Technologies | 62 | Expired |
| US7877722B2 | Systems and methods for creating inspection recipes | Physics | 61 | Active |
| US8041103B2 | Methods and systems for determining a position of inspection data in design data space | Physics | 61 | Active |
| US7756658B2 | Systems and methods for detecting defects on a wafer and generating inspection results for the wafer | Emerging Cross-Sectional Technologies | 56 | Active |
| US6956718B1 | Sandwich diamond-like carbon overcoat for use in slider designs of proximity recording heads | Physics | 44 | Expired |
| US8139843B2 | Methods and systems for utilizing design data in combination with inspection data | Electricity | 40 | Active |
| US8600143B1 | Method and system for hierarchical tissue analysis and classification | Physics | 32 | Active |
| US6775819B1 | Software system and method for graphically building customized recipe flowcharts | Physics | 28 | Expired |
| US7729529B2 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Physics | 27 | Active |
| US8611639B2 | Semiconductor device property extraction, generation, visualization, and monitoring methods | Physics | 24 | Active |
| US8111900B2 | Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle | Physics | 20 | Active |
| US10043261B2 | Generating simulated output for a specimen | Physics | 19 | Active |
| US7440607B1 | Outlier substrate inspection | Physics | 19 | Active |
| US9098891B2 | Adaptive sampling for semiconductor inspection recipe creation, defect review, and metrology | Physics | 18 | Active |
| US7142992B1 | Flexible hybrid defect classification for semiconductor manufacturing | Physics | 16 | Expired |
| US8781781B2 | Dynamic care areas | Emerging Cross-Sectional Technologies | 15 | Active |
| US9041930B1 | Digital pathology system | Physics | 14 | Active |
| US6985220B1 | Interactive threshold tuning | Emerging Cross-Sectional Technologies | 13 | Expired |
| US10181185B2 | Image based specimen process control | Electricity | 9 | Active |
| US9401016B2 | Using high resolution full die image data for inspection | Physics | 8 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.