Bongsub Lee
17Patents
4h-index
19Co-inventors
49Inventor score
Filing activity: Apr 30, 2015 → Aug 17, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10998292B2 | Offset pads over TSV | Electricity | 132 | Active |
| US11004757B2 | Bonded structures | Electricity | 100 | Active |
| US11393779B2 | Large metal pads over TSV | Electricity | 49 | Active |
| US11749645B2 | TSV as pad | Electricity | 7 | Active |
| US11955393B2 | Structures for bonding elements including conductive interface features | Electricity | 3 | Active |
| US11728313B2 | Offset pads over TSV | Electricity | 2 | Active |
| US9847238B2 | Fan-out wafer-level packaging using metal foil lamination | Electricity | 2 | Active |
| US11955445B2 | Metal pads over TSV | Electricity | 2 | Active |
| US9543277B1 | Wafer level packages with mechanically decoupled fan-in and fan-out areas | Electricity | 2 | Active |
| US12243851B2 | Offset pads over TSV | Electricity | 1 | Active |
| US9646946B2 | Fan-out wafer-level packaging using metal foil lamination | Electricity | 1 | Active |
| US10008469B2 | Wafer-level packaging using wire bond wires in place of a redistribution layer | Electricity | 1 | Active |
| US9502372B1 | Wafer-level packaging using wire bond wires in place of a redistribution layer | Electricity | 0 | Active |
| US10304803B2 | Nanoscale interconnect array for stacked dies | Electricity | 0 | Active |
| US9859234B2 | Methods and structures to repair device warpage | Electricity | 0 | Active |
| US10600761B2 | Nanoscale interconnect array for stacked dies | Electricity | 0 | Active |
| US12205926B2 | TSV as pad | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.