Inventor · Cameron Park, CA, US

Bradley Scott Withers

18Patents
4h-index
12Co-inventors
57Inventor score

Filing activity: Oct 11, 1996 → Aug 18, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US5722877A Technique for improving within-wafer non-uniformity of material removal for performing CMP Performing Operations; Transporting 109 Expired
USD727579S1 Brush core for a sponge brush General 13 Active
US10271636B2 Archimedes brush for semiconductor cleaning Human Necessities 4 Active
US8778087B2 Conical sponge brush for cleaning semiconductor wafers Human Necessities 4 Active
US8898845B2 Brush mandrel for PVA sponge brush Human Necessities 1 Active
US9202723B2 Brush with cantilevered nodules Human Necessities 1 Active
US7795150B2 Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition Electricity 1 Expired
US11684144B2 Hybrid material post-CMP brushes and methods for forming the same Performing Operations; Transporting 0 Active
US10410936B2 Methods and apparatuses for effluent monitoring for brush conditioning Performing Operations; Transporting 0 Active
US7344989B2 CMP wafer contamination reduced by insitu clean Electricity 0 Expired
US10405166B2 Methods and apparatuses for wireless communication with a brush Electricity 0 Active
US11205582B2 Methods and apparatuses for effluent monitoring for brush conditioning Performing Operations; Transporting 0 Active
US11923208B2 Methods and apparatuses for chemical delivery for brush conditioning Electricity 0 Active
US11694910B2 Brush with non-constant nodule density Human Necessities 0 Active
US8857001B2 Brush mandrel for PVA sponge brush General 0 Revoked
US9455163B2 Brush mandrel for PVA sponge brush Human Necessities 0 Active
US9237797B2 Conical sponge brush for cleaning semiconductor wafers Human Necessities 0 Active
US10149135B1 Methods and apparatuses for wireless communication with a brush Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.