Christopher A. Goeden
16Patents
6h-index
11Co-inventors
59Inventor score
Filing activity: Jan 15, 2002 → Mar 18, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6859278B1 | Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems | Physics | 18 | Expired |
| US7277171B1 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Physics | 12 | Expired |
| US7505134B1 | Automated ellipsometer and the like systems | Physics | 11 | Active |
| US7746471B1 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Physics | 8 | Active |
| US7136172B1 | System and method for setting and compensating errors in AOI and POI of a beam of EM radiation | Physics | 7 | Expired |
| US7746472B1 | Automated ellipsometer and the like systems | Physics | 6 | Active |
| US7265838B1 | Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like | Physics | 5 | Expired |
| US7535566B1 | Beam chromatic shifting and directing means | Physics | 3 | Active |
| US7099006B1 | Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means | Physics | 3 | Expired |
| US7796260B1 | System and method of controlling intensity of an electromagnetic beam | Physics | 2 | Active |
| US7619752B2 | Sample orientation system and method | Physics | 2 | Active |
| US7522279B1 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Physics | 2 | Active |
| US7057717B1 | System for and method of investigating the exact same point on a sample substrate with at least two wavelengths | Physics | 2 | Expired |
| US7508510B2 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Physics | 1 | Active |
| US9546943B1 | System and method for investigating change in optical properties of a porous effective substrate surface as a function of a sequence of solvent partial pressures at atmospheric pressure | Physics | 0 | Active |
| US7301631B1 | Control of uncertain angle of incidence of beam from Arc lamp | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.