Daniel E. Grupp
47Patents
15h-index
19Co-inventors
78Inventor score
Filing activity: Nov 3, 1994 → Apr 8, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6891234B1 | Transistor with workfunction-induced charge layer | Electricity | 157 | Expired |
| US6236033A | Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography | Performing Operations; Transporting | 100 | Expired |
| US7112478B2 | Insulated gate field effect transistor having passivated Schottky barriers to the channel | Emerging Cross-Sectional Technologies | 77 | Expired |
| US6198113A | Electrostatically operated tunneling transistor | Emerging Cross-Sectional Technologies | 56 | Expired |
| US7176483B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 54 | Expired |
| US7084423B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 49 | Expired |
| US9232959B2 | Multi fluid tissue resection methods and devices | Human Necessities | 38 | Active |
| US7382021B2 | Insulated gate field-effect transistor having III-VI source/drain layer(s) | Electricity | 25 | Expired |
| US6833556B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 23 | Expired |
| US7884003B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 23 | Active |
| US7462860B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 21 | Expired |
| US9209261B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 20 | Active |
| US7883980B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 18 | Active |
| US8263467B2 | Process for fabricating a self-aligned deposited source/drain insulated gate field-effect transistor | Electricity | 16 | Active |
| US9425277B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 16 | Active |
| US9461167B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
| US8658523B2 | Method for making semiconductor insulated-gate field-effect transistor having multilayer deposited metal source(s) and/or drain(s) | Electricity | 15 | Active |
| US10090395B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
| US9905691B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
| US7816240B2 | Method for making semiconductor insulated-gate field-effect transistor having multilayer deposited metal source(s) and/or drain(s) | Electricity | 13 | Active |
| US8916437B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 12 | Active |
| US8377767B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 11 | Active |
| US8766336B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 10 | Active |
| US5586064A | Active magnetic field compensation system using a single filter | Physics | 10 | Expired |
| US8431469B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.