Eui-Joon Yoon
13Patents
6h-index
23Co-inventors
66Inventor score
Filing activity: Nov 22, 1995 → Feb 5, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6054331A | Apparatus and methods of depositing a platinum film with anti-oxidizing function over a substrate | Electricity | 62 | Expired |
| US7148541B2 | Vertical channel field effect transistors having insulating layers thereon | Electricity | 37 | Expired |
| US6025205A | Apparatus and methods of forming preferred orientation-controlled platinum films using nitrogen | Electricity | 23 | Expired |
| US5736422A | Method for depositing a platinum layer on a silicon wafer | Electricity | 23 | Expired |
| US6498097B1 | Apparatus and method of forming preferred orientation-controlled platinum film using oxygen | Electricity | 19 | Expired |
| US6723186B2 | Method of manufacturing metallic film consisting of giant single crystal grains | Chemistry; Metallurgy | 6 | Expired |
| US7459359B2 | Methods of fabricating vertical channel field effect transistors having insulating layers thereon | Electricity | 4 | Active |
| US5981390A | Method for depositing a platinum layer on a silicon wafer | Electricity | 3 | Expired |
| US6312567A | Method of forming a (200)-oriented platinum layer | Electricity | 3 | Expired |
| US10205052B2 | Semiconductor stacking structure, and method and apparatus for separating nitride semiconductor layer using same | Electricity | 2 | Active |
| US9978907B2 | Semiconductor ultraviolet light emitting device having improved light extraction efficiency | Electricity | 1 | Active |
| US10916681B2 | Semiconductor stacking structure, and method and apparatus for separating nitride semiconductor layer using same | Electricity | 0 | Active |
| US11476388B2 | Semiconductor stacking structure, and method and apparatus for separating nitride semiconductor layer using same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.