Fan Ho
57Patents
15h-index
25Co-inventors
84Inventor score
Filing activity: Aug 14, 1992 → Sep 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6365421B2 | Method and apparatus for storage of test results within an integrated circuit | Physics | 73 | Expired |
| US6194738A | Method and apparatus for storage of test results within an integrated circuit | Physics | 67 | Expired |
| US5631862A | Self current limiting antifuse circuit | Physics | 52 | Expired |
| US5838625A | Anti-fuse programming path | Physics | 43 | Expired |
| US7768847B2 | Programmable memory repair scheme | Physics | 39 | Active |
| US10446256B2 | Controller to detect malfunctioning address of memory device | Physics | 34 | Active |
| US5293057A | Electrostatic discharge protection circuit for semiconductor device | Electricity | 27 | Expired |
| US9117496B2 | Memory device comprising programmable command-and-address and/or data interfaces | Electricity | 26 | Active |
| US5706238A | Self current limiting antifuse circuit | Physics | 23 | Expired |
| US6323536A | Method and apparatus for forming a junctionless antifuse | Electricity | 21 | Expired |
| US6069064A | Method for forming a junctionless antifuse | Electricity | 21 | Expired |
| US6525399B2 | Junctionless antifuses and systems containing junctionless antifuses | Electricity | 17 | Expired |
| US5973978A | Anti-fuse programming path | Physics | 16 | Expired |
| US6456149B2 | Low current redundancy anti-fuse method and apparatus | Physics | 16 | Expired |
| US6754866B1 | Testing of integrated circuit devices | Physics | 16 | Expired |
| US6185705A | Method and apparatus for checking the resistance of programmable elements | Physics | 15 | Expired |
| US8670283B2 | Controller to detect malfunctioning address of memory device | Physics | 14 | Active |
| US7103815B2 | Testing of integrated circuit devices | Physics | 14 | Expired |
| US6444558B1 | Methods of forming and programming junctionless antifuses | Electricity | 14 | Expired |
| USRE36024E | Electrostatic discharge protection circuit for semiconductor device | General | 13 | Expired |
| US8446788B2 | Programmable memory repair scheme | Physics | 12 | Active |
| US5847987A | Low currency redundancy anti-fuse method and apparatus | Physics | 11 | Expired |
| US6154398A | Low current redundancy anti-fuse method and apparatus | Physics | 11 | Expired |
| US9129712B2 | Programmable memory repair scheme | Physics | 10 | Active |
| US7808092B2 | Semiconductor device with a plurality of ground planes | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.