Gary Janik
50Patents
15h-index
49Co-inventors
84Inventor score
Filing activity: Jul 24, 1986 → Nov 30, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6816570B2 | Multi-technique thin film analysis tool | Physics | 71 | Expired |
| US7067819B2 | Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light | Physics | 51 | Expired |
| US7039158B1 | Multi-technique thin film analysis tool | Physics | 46 | Expired |
| US6999180B1 | Optical film topography and thickness measurement | Physics | 46 | Expired |
| US6771735B2 | Method and apparatus for improved x-ray reflection measurement | Physics | 40 | Expired |
| US5404217A | Laser liquid flow cell manifold system and method for assembly | Physics | 38 | Expired |
| US7369233B2 | Optical system for measuring samples using short wavelength radiation | Physics | 38 | Expired |
| US7006596B1 | Light element measurement | Electricity | 37 | Expired |
| US6711232B1 | X-ray reflectivity measurement | Physics | 34 | Expired |
| US7433056B1 | Scatterometry metrology using inelastic scattering | Physics | 31 | Active |
| US7359052B2 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | Physics | 27 | Expired |
| US5475235A | Control of laser light power output for use in light scattering instruments by inducing mode hopping and averaging result | Electricity | 25 | Expired |
| US5530540A | Light scattering measurement cell for very small volumes | Physics | 23 | Expired |
| US4765736A | Frequency modulation spectroscopy using dual frequency modulation and detection | Physics | 20 | Expired |
| US6128080A | Extended range interferometric refractometer | Physics | 17 | Expired |
| US7072442B1 | X-ray metrology using a transmissive x-ray optical element | Physics | 14 | Expired |
| US7253901B2 | Laser-based cleaning device for film analysis tool | Physics | 13 | Expired |
| US6788760B1 | Methods and apparatus for characterizing thin films | Electricity | 13 | Expired |
| US7274440B1 | Systems and methods for measuring stress in a specimen | Electricity | 11 | Expired |
| US7075073B1 | Angle resolved x-ray detection | Physics | 11 | Expired |
| US7139365B1 | X-ray reflectivity system with variable spot | Physics | 10 | Expired |
| US5676830A | Method and apparatus for reducing band broadening in chromatographic detectors | Physics | 10 | Expired |
| US5900152A | Apparatus to reduce inhomogeneities in optical flow cells | Physics | 10 | Expired |
| US7166838B1 | X-ray imaging for patterned film measurement | Physics | 8 | Expired |
| US7564552B2 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | Physics | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.