Glen Gilfeather
20Patents
7h-index
27Co-inventors
65Inventor score
Filing activity: May 15, 1987 → Dec 20, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4819047A | Protection system for CMOS integrated circuits | Electricity | 57 | Expired |
| US4870530A | Electrostatic discharge protection circuitry for any two external pins of an I.C. package | Electricity | 52 | Expired |
| US6069366A | Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit | Physics | 20 | Expired |
| US6897664B1 | Laser beam induced phenomena detection | Physics | 18 | Expired |
| US5972725A | Device analysis for face down chip | Emerging Cross-Sectional Technologies | 18 | Expired |
| US6372627B1 | Method and arrangement for characterization of focused-ion-beam insulator deposition | Physics | 12 | Expired |
| US7088852B1 | Three-dimensional tomography | Physics | 7 | Expired |
| US6171944A | Method for bringing up lower level metal nodes of multi-layered integrated circuits for signal acquisition | Electricity | 6 | Expired |
| US6566888B1 | Repair of resistive electrical connections in an integrated circuit | Electricity | 6 | Expired |
| US6469529B1 | Time-resolved emission microscopy system | Physics | 6 | Expired |
| US6518661B1 | Apparatus for metal stack thermal management in semiconductor devices | Electricity | 5 | Expired |
| US6285036A | Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit | Physics | 5 | Expired |
| US6352871B1 | Probe grid for integrated circuit excitation | Physics | 4 | Expired |
| US6833718B1 | Photon beacon | Physics | 3 | Expired |
| US6455334B1 | Probe grid for integrated circuit analysis | Emerging Cross-Sectional Technologies | 3 | Expired |
| US6700659B1 | Semiconductor analysis arrangement and method therefor | Physics | 3 | Expired |
| US6716683B1 | Optical analysis for SOI integrated circuits | Physics | 3 | Expired |
| US6635839B1 | Semiconductor analysis arrangement and method therefor | Physics | 2 | Expired |
| US6844928B1 | Fiber optic semiconductor analysis arrangement and method therefor | Physics | 1 | Expired |
| US6661246B1 | Constant-current VDDQ testing of integrated circuits | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.