Hisanori Yokura
21Patents
5h-index
23Co-inventors
69Inventor score
Filing activity: Sep 8, 1999 → Jul 15, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7821085B2 | Physical quantity sensor and method for manufacturing the same | Physics | 19 | Active |
| US8497557B2 | Semiconductor device | Electricity | 17 | Active |
| US7157781B2 | Enhancement of membrane characteristics in semiconductor device with membrane | Performing Operations; Transporting | 8 | Expired |
| US9664768B2 | Magnetic sensor | Performing Operations; Transporting | 6 | Active |
| US6316300A | Method of manufacturing a semiconductor device having an oxidation process for selectively forming an oxide film | Electricity | 6 | Expired |
| US7387024B2 | Capacitive type humidity sensor | Physics | 4 | Expired |
| US7644623B2 | Semiconductor sensor for measuring a physical quantity and method of manufacturing the same | Emerging Cross-Sectional Technologies | 4 | Active |
| US9024632B2 | Magnetic sensor with a plurality of heater portions to fix the direction of magnetization of a pinned magnetic layer | Emerging Cross-Sectional Technologies | 4 | Active |
| US8413507B2 | Semiconductor dynamic quantity sensor and method of manufacturing the same | Physics | 3 | Active |
| US7071709B2 | Circuit for detecting capacitance change in variable capacitance | Physics | 3 | Expired |
| US7154094B2 | Fabri-Perot filter | Physics | 2 | Expired |
| US8089144B2 | Semiconductor device and method for manufacturing the same | Electricity | 2 | Active |
| US8169082B2 | Semiconductor device and method for manufacturing the same | Electricity | 1 | Active |
| US10468322B2 | Semiconductor device capable of suppressing cracks of through-hole protective film and short circuit of adjacent through-electrodes | Electricity | 1 | Active |
| US9105753B2 | Semiconductor physical quantity sensor and method for manufacturing the same | Electricity | 1 | Active |
| US9349644B2 | Semiconductor device producing method | Electricity | 1 | Active |
| US8785231B2 | Method of making semiconductor device | Electricity | 1 | Active |
| US8106471B2 | Semiconductor dynamic quantity sensor and method of producing the same | Physics | 0 | Active |
| US11054326B2 | Physical quantity sensor | Physics | 0 | Active |
| US9944515B2 | Manufacturing method of semiconductor device | Electricity | 0 | Active |
| US9835507B2 | Dynamic quantity sensor | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.