Jay T. Scheuer
28Patents
5h-index
54Co-inventors
72Inventor score
Filing activity: Jan 16, 2002 → May 27, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7126808B2 | Wafer platen equipped with electrostatic clamp, wafer backside gas cooling, and high voltage operation capability for plasma doping | Emerging Cross-Sectional Technologies | 56 | Expired |
| US6791097B2 | Adjustable conductance limiting aperture for ion implanters | Electricity | 10 | Expired |
| US7132672B2 | Faraday dose and uniformity monitor for plasma based ion implantation | Electricity | 9 | Expired |
| US9685298B1 | Apparatus and method for contamination control in ion beam apparatus | Electricity | 6 | Active |
| US8142607B2 | High density helicon plasma source for wide ribbon ion beam generation | Electricity | 5 | Active |
| US8330127B2 | Flexible ion source | Electricity | 5 | Active |
| US9761410B2 | Apparatus and method for in-situ cleaning in ion beam apparatus | Electricity | 4 | Active |
| US7878145B2 | Monitoring plasma ion implantation systems for fault detection and process control | Electricity | 4 | Active |
| US8590485B2 | Small form factor plasma source for high density wide ribbon ion beam generation | Electricity | 3 | Active |
| US7999479B2 | Conjugated ICP and ECR plasma sources for wide ribbon ion beam generation and control | Emerging Cross-Sectional Technologies | 3 | Active |
| US11127557B1 | Ion source with single-slot tubular cathode | Electricity | 2 | Active |
| US9805931B2 | Liquid immersion doping | Electricity | 2 | Active |
| US10522330B2 | In-situ plasma cleaning of process chamber components | Electricity | 2 | Active |
| US7521691B2 | Magnetic monitoring of a Faraday cup for an ion implanter | Electricity | 2 | Active |
| US9187832B2 | Extended lifetime ion source | Electricity | 1 | Active |
| US7622722B2 | Ion implantation device with a dual pumping mode and method thereof | Electricity | 1 | Active |
| US10410844B2 | RF clean system for electrostatic elements | Electricity | 1 | Active |
| US11810746B2 | Variable thickness ion source extraction plate | Electricity | 0 | Active |
| US10818469B2 | Cylindrical shaped arc chamber for indirectly heated cathode ion source | Electricity | 0 | Active |
| USD1051838S1 | Single-slot tubular cathode | General | 0 | Active |
| US11037758B2 | In-situ plasma cleaning of process chamber components | Electricity | 0 | Active |
| US11631567B2 | Ion source with single-slot tubular cathode | Electricity | 0 | Active |
| US11495434B2 | In-situ plasma cleaning of process chamber components | Electricity | 0 | Active |
| US11437215B2 | Electrostatic filter providing reduced particle generation | Electricity | 0 | Active |
| US12191113B2 | Systems and methods for optimizing full horizontal scanned beam distance | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.