Jeffrey S. Leib
26Patents
3h-index
22Co-inventors
59Inventor score
Filing activity: Dec 19, 2013 → Feb 7, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10121875B1 | Replacement gate structures for advanced integrated circuit structure fabrication | Electricity | 49 | Active |
| US10741669B2 | Differentiated voltage threshold metal gate structures for advanced integrated circuit structure fabrication | Electricity | 9 | Active |
| US9704744B2 | Method of forming a wrap-around contact on a semiconductor device | Electricity | 5 | Active |
| US10790378B2 | Replacement gate structures for advanced integrated circuit structure fabrication | Electricity | 3 | Active |
| US11018222B1 | Metallization in integrated circuit structures | Electricity | 3 | Active |
| US10886383B2 | Replacement gate structures for advanced integrated circuit structure fabrication | Electricity | 3 | Active |
| US10796968B2 | Dual metal silicide structures for advanced integrated circuit structure fabrication | Electricity | 3 | Active |
| US10727313B2 | Dual metal gate structures for advanced integrated circuit structure fabrication | Electricity | 3 | Active |
| US10840151B2 | Dual metal silicide structures for advanced integrated circuit structure fabrication | Electricity | 3 | Active |
| US11088261B2 | Trench contact structures for advanced integrated circuit structure fabrication | Electricity | 2 | Active |
| US11508626B2 | Dual metal silicide structures for advanced integrated circuit structure fabrication | Electricity | 2 | Active |
| US10957782B2 | Trench contact structures for advanced integrated circuit structure fabrication | Electricity | 1 | Active |
| US9711399B2 | Direct plasma densification process and semiconductor devices | Electricity | 1 | Active |
| US11664439B2 | Trench contact structures for advanced integrated circuit structure fabrication | Electricity | 1 | Active |
| US10854732B2 | Dual metal gate structures for advanced integrated circuit structure fabrication | Electricity | 1 | Active |
| US11063151B2 | Metal chemical vapor deposition approaches for fabricating wrap-around contacts and resulting structures | Electricity | 0 | Active |
| US11961767B2 | Dual metal silicide structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US11955532B2 | Dual metal gate structure having portions of metal gate layers in contact with a gate dielectric | Electricity | 0 | Active |
| US11482611B2 | Replacement gate structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US11948997B2 | Trench contact structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US12255247B2 | Trench contact structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US11342445B2 | Differentiated voltage threshold metal gate structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
| US12051698B2 | Fabrication of gate-all-around integrated circuit structures having molybdenum nitride metal gates and gate dielectrics with a dipole layer | Electricity | 0 | Active |
| US10297499B2 | Method of forming a wrap-around contact on a semiconductor device | Electricity | 0 | Active |
| US12225740B2 | Dual metal silicide structures for advanced integrated circuit structure fabrication | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.