Joaquin Torres
17Patents
6h-index
15Co-inventors
59Inventor score
Filing activity: Feb 21, 2001 → Sep 15, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6828646B2 | Isolating trench and manufacturing process | Electricity | 70 | Expired |
| US7172980B2 | Process for fabricating an integrated electronic circuit that incorporates air gaps | Electricity | 32 | Expired |
| US6846690B2 | Integrated circuit comprising an auxiliary component, for example a passive component or a microelectromechanical system, placed above an electronic chip, and the corresponding fabrication process | Performing Operations; Transporting | 16 | Expired |
| US8470685B2 | Integration of self-aligned trenches in-between metal lines | Electricity | 14 | Active |
| US8072075B2 | CuSiN/SiN diffusion barrier for copper in integrated-circuit devices | Electricity | 14 | Active |
| US6528419B1 | Process of fabricating an integrated circuit | Electricity | 6 | Expired |
| US8138082B2 | Method for forming metal interconnects in a dielectric material | Electricity | 6 | Active |
| US8110879B2 | Controlling lateral distribution of air gaps in interconnects | Electricity | 5 | Active |
| US8399772B2 | Control of carbon nanostructure growth in an interconnect structure | Electricity | 5 | Active |
| US7816266B2 | Copper diffusion barrier | Electricity | 2 | Active |
| US7605071B2 | Controlling lateral distribution of air gaps in interconnects | Electricity | 2 | Active |
| US7553739B2 | Integration control and reliability enhancement of interconnect air cavities | Electricity | 1 | Active |
| US8729701B2 | Copper diffusion barrier | Electricity | 1 | Active |
| US8143157B2 | Fabrication of a diffusion barrier cap on copper containing conductive elements | Electricity | 1 | Active |
| US8424177B2 | MIM capacitor with enhanced capacitance | Emerging Cross-Sectional Technologies | 1 | Active |
| US7630191B2 | MIM capacitor | Electricity | 0 | Active |
| US7989342B2 | Formation of a reliable diffusion-barrier cap on a Cu-containing interconnect element having grains with different crystal orientations | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.