Inventor · Malibu, CA, US

John W. Peters

15Patents
13h-index
12Co-inventors
67Inventor score

Filing activity: May 24, 1978 → Aug 12, 1985

Most-cited inventions

PatentTitleAreaCited byStatus
US4545646A Process for forming a graded index optical material and structures formed thereby Emerging Cross-Sectional Technologies 72 Expired
US4371587A Low temperature process for depositing oxide layers by photochemical vapor deposition Emerging Cross-Sectional Technologies 67 Expired
US4652463A Process for depositing a conductive oxide layer Emerging Cross-Sectional Technologies 53 Expired
US4447469A Process for forming sulfide layers by photochemical vapor deposition Emerging Cross-Sectional Technologies 48 Expired
US4615294A Barrel reactor and method for photochemical vapor deposition Chemistry; Metallurgy 40 Expired
US4181751A Process for the preparation of low temperature silicon nitride films by photochemical vapor deposition Electricity 28 Expired
US4597986A Method for photochemical vapor deposition Chemistry; Metallurgy 26 Expired
US4265932A Mobile transparent window apparatus and method for photochemical vapor deposition Chemistry; Metallurgy 26 Expired
US4474829A Low-temperature charge-free process for forming native oxide layers Electricity 20 Expired
US4543271A Silicon oxynitride material and photochemical process for forming same Electricity 20 Expired
US4623426A Low temperature process for depositing epitaxial layers Chemistry; Metallurgy 16 Expired
US4631199A Photochemical vapor deposition process for depositing oxide layers Electricity 15 Expired
US4419385A Low temperature process for depositing an oxide dielectric layer on a conductive surface and multilayer structures formed thereby Electricity 13 Expired
US4513057A Process for forming sulfide layers Emerging Cross-Sectional Technologies 9 Expired
US4346077A Method for reducing incidence of periparturient disorders in cows Human Necessities 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.