Johnny Chan
44Patents
8h-index
28Co-inventors
75Inventor score
Filing activity: May 12, 1998 → Jun 3, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8807131B1 | Compliance monitoring for asthma inhalers | Electricity | 146 | Active |
| US8171094B2 | System and method for communicating over a network with a medical device | Physics | 79 | Active |
| US8082312B2 | System and method for communicating over a network with a medical device | Human Necessities | 77 | Active |
| US8060576B2 | System and method for communicating over a network with a medical device | Physics | 73 | Active |
| US6038185A | Method and apparatus for a serial access memory | Physics | 26 | Expired |
| US7505443B2 | System and method for broadcasting application-specific information in wireless local area networks | Electricity | 24 | Expired |
| US7848151B2 | Circuit to control voltage ramp rate | Physics | 12 | Active |
| US7512008B2 | Circuit to control voltage ramp rate | Physics | 9 | Expired |
| US7427890B2 | Charge pump regulator with multiple control options | Emerging Cross-Sectional Technologies | 8 | Active |
| US7279961B2 | Charge pump for intermediate voltage | Electricity | 8 | Expired |
| US7180795B1 | Method of sensing an EEPROM reference cell | Physics | 8 | Expired |
| US9576652B1 | Resistive random access memory apparatus with forward and reverse reading modes | Physics | 8 | Active |
| US7145318B1 | Negative voltage regulator | Physics | 7 | Expired |
| US6097657A | Method for reading out the contents of a serial memory | Physics | 6 | Expired |
| US7519486B2 | Method and apparatus to test the power-on-reset trip point of an integrated circuit | Physics | 6 | Active |
| US7369446B2 | Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memory | Physics | 5 | Active |
| US8804436B1 | Method of partial refresh during erase operation | Physics | 5 | Active |
| US6998884B2 | Circuit for auto-clamping input pins to a definite voltage during power-up or reset | Electricity | 5 | Expired |
| US7710105B2 | Circuit reset testing methods | Physics | 5 | Active |
| US8953384B2 | Sense amplifier for flash memory | Physics | 4 | Active |
| US9627091B1 | Memory device and stress testing method of same | Physics | 4 | Active |
| US7863959B2 | Apparatus and methods for a high-voltage latch | Physics | 3 | Active |
| US6891917B2 | Shift register with reduced area and power consumption | Physics | 3 | Expired |
| US7751256B2 | Method and apparatus to prevent high voltage supply degradation for high-voltage latches of a non-volatile memory | Physics | 3 | Active |
| US7257668B2 | Method and system for enhancing the endurance of memory cells | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.