Jun Hirota
21Patents
5h-index
30Co-inventors
69Inventor score
Filing activity: Apr 18, 1977 → Dec 2, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8084830B2 | Nonvolatile semiconductor memory device | Electricity | 67 | Active |
| US7463297B2 | Liquid crystal display device provided with an image capturing function | Physics | 38 | Active |
| US8664631B2 | Nonvolatile memory device | Electricity | 9 | Active |
| US8436331B2 | Memory device and method for manufacturing same | Electricity | 5 | Active |
| US7759796B2 | Semiconductor device with two barrier layers formed between copper-containing line layer and aluminum-containing conductive layer | Electricity | 5 | Active |
| US8309958B2 | Semiconductor memory device and method of manufacturing same | Electricity | 3 | Active |
| US7392058B2 | Communication terminal device, information providing device, and cellular telephone system | Electricity | 2 | Active |
| US7521352B2 | Method for manufacturing a semiconductor device | Electricity | 1 | Active |
| US4097661A | Process for producing conjugated diolefinic polymers | Chemistry; Metallurgy | 1 | Expired |
| US10437526B2 | Printing method, sound control system, and program | Physics | 1 | Active |
| US8558354B2 | Semiconductor device and method for manufacturing the same | Electricity | 1 | Active |
| US9410983B2 | Scanning probe microscope | Physics | 1 | Active |
| US10606024B2 | Lens moving mechanism | Physics | 0 | Active |
| US12153275B2 | Alignment device and lens alignment system | Electricity | 0 | Active |
| US10718927B2 | Lens moving mechanism | Physics | 0 | Active |
| US10859895B2 | Projector apparatus | Electricity | 0 | Active |
| US11009067B2 | Mounting structure of bearing member and speed reducing apparatus | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US10545170B2 | Measuring method of scanning probe microscopy using penetrative pressing force | Physics | 0 | Active |
| US10712528B2 | Lens moving mechanism | Electricity | 0 | Active |
| US11060990B2 | Semiconductor measurement device and method of measuring semiconductor | Electricity | 0 | Active |
| US10345336B2 | Scanning probe microscope and measurement method using the same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.