Lance Scudder
18Patents
5h-index
25Co-inventors
58Inventor score
Filing activity: May 11, 2012 → Apr 26, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8569156B1 | Reducing or eliminating pre-amorphization in transistor manufacture | Electricity | 19 | Active |
| US9112057B1 | Semiconductor devices with dopant migration suppression and method of fabrication thereof | Electricity | 10 | Active |
| US8796048B1 | Monitoring and measurement of thin film layers | Electricity | 6 | Active |
| US8614128B1 | CMOS structures and processes based on selective thinning | Electricity | 6 | Active |
| US8877619B1 | Process for manufacture of integrated circuits with different channel doping transistor architectures and devices therefrom | Electricity | 6 | Active |
| US9299698B2 | Semiconductor structure with multiple transistors having various threshold voltages | Electricity | 5 | Active |
| US8937005B2 | Reducing or eliminating pre-amorphization in transistor manufacture | Electricity | 4 | Active |
| US9041126B2 | Deeply depleted MOS transistors having a screening layer and methods thereof | Electricity | 4 | Active |
| US8637955B1 | Semiconductor structure with reduced junction leakage and method of fabrication thereof | Electricity | 3 | Active |
| US8999861B1 | Semiconductor structure with substitutional boron and method for fabrication thereof | Electricity | 2 | Active |
| US8778786B1 | Method for substrate preservation during transistor fabrication | Electricity | 1 | Active |
| US9391076B1 | CMOS structures and processes based on selective thinning | Electricity | 1 | Active |
| US10014387B2 | Semiconductor structure with multiple transistors having various threshold voltages | Electricity | 0 | Active |
| US10217838B2 | Semiconductor structure with multiple transistors having various threshold voltages | Electricity | 0 | Active |
| US9514940B2 | Reducing or eliminating pre-amorphization in transistor manufacture | Electricity | 0 | Active |
| US9105711B2 | Semiconductor structure with reduced junction leakage and method of fabrication thereof | Electricity | 0 | Active |
| US9812550B2 | Semiconductor structure with multiple transistors having various threshold voltages | Electricity | 0 | Active |
| US9793172B2 | Reducing or eliminating pre-amorphization in transistor manufacture | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.