Mona A. Ebrish
16Patents
2h-index
25Co-inventors
46Inventor score
Filing activity: May 18, 2016 → Jun 17, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9799736B1 | High acceptor level doping in silicon germanium | Electricity | 398 | Active |
| US10734523B2 | Nanosheet substrate to source/drain isolation | Performing Operations; Transporting | 4 | Active |
| US10361306B2 | High acceptor level doping in silicon germanium | Electricity | 2 | Active |
| US9711507B1 | Separate N and P fin etching for reduced CMOS device leakage | Electricity | 2 | Active |
| US10811528B2 | Two step fin etch and reveal for VTFETs and high breakdown LDVTFETs | Electricity | 2 | Active |
| US9666486B1 | Contained punch through stopper for CMOS structures on a strain relaxed buffer substrate | Electricity | 2 | Active |
| US11031250B2 | Semiconductor structures of more uniform thickness | Electricity | 1 | Active |
| US10229910B2 | Separate N and P fin etching for reduced CMOS device leakage | Electricity | 0 | Active |
| US10381348B2 | Structure and method for equal substrate to channel height between N and P fin-FETs | Electricity | 0 | Active |
| US10361127B1 | Vertical transport FET with two or more gate lengths | Electricity | 0 | Active |
| US10804106B2 | High temperature ultra-fast annealed soft mask for semiconductor devices | Electricity | 0 | Active |
| US11043494B2 | Structure and method for equal substrate to channel height between N and P fin-FETs | Electricity | 0 | Active |
| US10388789B2 | Reducing series resistance between source and/or drain regions and a channel region | Electricity | 0 | Active |
| US10319855B2 | Reducing series resistance between source and/or drain regions and a channel region | Electricity | 0 | Active |
| US10818751B2 | Nanosheet transistor barrier for electrically isolating the substrate from the source or drain regions | Electricity | 0 | Active |
| US11569442B2 | Dielectric retention and method of forming memory pillar | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.