Inventor · Yongin-si, KR

Myungjun Lee

27Patents
3h-index
71Co-inventors
62Inventor score

Filing activity: Dec 18, 2007 → Oct 24, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US9040192B2 Lithium rechargeable battery Emerging Cross-Sectional Technologies 13 Active
US9121336B2 Diesel engine piston Emerging Cross-Sectional Technologies 6 Active
US10095122B1 Systems and methods for fabricating metrology targets with sub-resolution features Physics 5 Active
US10018919B2 System and method for fabricating metrology targets oriented with an angle rotated with respect to device features Physics 3 Active
US10209627B2 Systems and methods for focus-sensitive metrology targets Physics 2 Active
US9466604B2 Metal segments as landing pads and local interconnects in an IC device Electricity 2 Active
US12002698B2 Metrology apparatus and method based on diffraction using oblique illumination and method of manufacturing semiconductor device using the metrology method Physics 2 Active
US11726046B2 Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methods Physics 2 Active
US7833657B2 External case for secondary batteries and secondary battery using the external case Emerging Cross-Sectional Technologies 1 Active
US10579768B2 Process compatibility improvement by fill factor modulation Electricity 1 Active
US10216096B2 Process-sensitive metrology systems and methods Physics 1 Active
US10685165B2 Metrology using overlay and yield critical patterns Emerging Cross-Sectional Technologies 1 Active
US12045009B2 Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM Physics 0 Active
US12117347B2 Metrology target design for tilted device designs Electricity 0 Active
US11314205B2 Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM Physics 0 Active
US12405226B2 Substrate inspection apparatus and substrate inspection method Physics 0 Active
US9419268B2 Secondary battery and circuit board assembly suitable for secondary battery Emerging Cross-Sectional Technologies 0 Active
US12038718B2 Holographic microscope and manufacturing method of semiconductor device using the same Physics 0 Active
US11428947B2 Super-resolution holographic microscope Physics 0 Active
US11604136B2 Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement method Physics 0 Active
US11972960B2 Imaging ellipsometry (IE)-based inspection method and method of fabricating semiconductor device by using IE-based inspection method Physics 0 Active
US12307650B2 Scanning electron microscope device, semiconductor manufacturing device, and method of controlling semiconductor manufacturing device Electricity 0 Active
US11988495B2 Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation Physics 0 Active
US12228499B2 Pupil ellipsometry measurement apparatus and method and method of fabricating semiconductor device using the pupil ellipsometry measurement method Physics 0 Active
US12222282B2 Semiconductor measurement apparatus Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.