Patrick Reynaud
19Patents
5h-index
38Co-inventors
62Inventor score
Filing activity: Jan 16, 2004 → Jan 11, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7396357B2 | Ancillary tool and method for positioning a prosthetic acetabulum of a hip prosthesis | Human Necessities | 86 | Expired |
| US7405136B2 | Methods for manufacturing compound-material wafers and for recycling used donor substrates | Electricity | 15 | Active |
| US8821503B2 | Ancillary tool and method for positioning a prosthetic acetabulum of a hip prosthesis | Human Necessities | 8 | Active |
| US7413964B2 | Method of revealing crystalline defects in a bulk substrate | Physics | 8 | Active |
| US7736994B2 | Method for manufacturing compound material wafers and corresponding compound material wafer | Emerging Cross-Sectional Technologies | 8 | Active |
| US8962450B2 | Method for manufacturing a semiconductor-on-insulator structure having low electrical losses | Electricity | 3 | Active |
| US7892861B2 | Method for fabricating a compound-material wafer | Electricity | 2 | Active |
| US7718534B2 | Planarization of a heteroepitaxial layer | Performing Operations; Transporting | 2 | Active |
| US8658514B2 | Method for manufacturing a semiconductor-on-insulator structure having low electrical losses, and corresponding structure | Electricity | 1 | Active |
| US8962492B2 | Method to thin a silicon-on-insulator substrate | Electricity | 1 | Active |
| US8389412B2 | Finishing method for a silicon on insulator substrate | Electricity | 1 | Active |
| US10204786B2 | Device for connecting at least one nano-object and method of manufacturing it | Electricity | 0 | Active |
| US10107772B2 | Electronical device for measuring at least one electrical characteristic of an object | Physics | 0 | Active |
| US9244019B2 | Method for measuring defects in a silicon substrate by applying a heat treatment which consolidates and enlarges the defects | Physics | 0 | Active |
| US9698063B2 | Method of testing a semiconductor-on-insulator structure and application of said test to the fabrication of such a structure | Electricity | 0 | Active |
| US9293473B2 | Method for manufacturing a semiconductor on insulator structure having low electrical losses | Electricity | 0 | Active |
| US10858244B2 | Device for connecting at least one nano-object associated with a chip enabling a connection to at least one external electrical system and method of fabrication thereof | Electricity | 0 | Active |
| US11373856B2 | Support for a semiconductor structure | Electricity | 0 | Active |
| US9653536B2 | Method for fabricating a structure | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.