Peter Weigand
21Patents
9h-index
23Co-inventors
75Inventor score
Filing activity: Feb 6, 1989 → Nov 17, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5851899A | Gapfill and planarization process for shallow trench isolation | Electricity | 65 | Expired |
| US5937541A | Semiconductor wafer temperature measurement and control thereof using gas temperature measurement | Electricity | 37 | Expired |
| US6046503A | Metalization system having an enhanced thermal conductivity | Electricity | 36 | Expired |
| US6406545B2 | Semiconductor workpiece processing apparatus and method | Electricity | 28 | Expired |
| US6252292A | Vertical electrical cavity-fuse | Electricity | 27 | Expired |
| US5854126A | Method for forming metallization in semiconductor devices with a self-planarizing material | Electricity | 22 | Expired |
| US5415256A | Friction type torque-limiting clutch brake which splits into halves for easy replacement | Emerging Cross-Sectional Technologies | 13 | Expired |
| US10298898B2 | User feedback for real-time checking and improving quality of scanned image | Physics | 11 | Active |
| US6150072A | Method of manufacturing a shallow trench isolation structure for a semiconductor device | Electricity | 10 | Expired |
| US5899736A | Techniques for forming electrically blowable fuses on an integrated circuit | Electricity | 8 | Expired |
| US5992046A | Semiconductor wafer temperature measurement and control thereof using gas temperature measurement | Electricity | 7 | Expired |
| US5926716A | Method for forming a structure | Electricity | 7 | Expired |
| US10841551B2 | User feedback for real-time checking and improving quality of scanned image | Physics | 7 | Active |
| US6492282B1 | Integrated circuits and manufacturing methods | Electricity | 7 | Expired |
| US5963837A | Method of planarizing the semiconductor structure | Electricity | 6 | Expired |
| US6136709A | Metal line deposition process | Electricity | 5 | Expired |
| US4952108A | Apparatus for automatically feeding a sequence of crucibles to a test oven | Physics | 5 | Expired |
| US5977635A | Multi-level conductive structure including low capacitance material | Electricity | 3 | Expired |
| US11563926B2 | User feedback for real-time checking and improving quality of scanned image | Physics | 2 | Active |
| US6015988A | Microstructure and methods for fabricating such structure | Electricity | 0 | Expired |
| US9758291B2 | Port arrangement for an internal component | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.