Robert Chebi
25Patents
10h-index
34Co-inventors
75Inventor score
Filing activity: Jun 28, 1991 → Aug 19, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7476291B2 | High chamber temperature process and chamber design for photo-resist stripping and post-metal etch passivation | Electricity | 506 | Active |
| US8298336B2 | High strip rate downstream chamber | Emerging Cross-Sectional Technologies | 361 | Active |
| US8425682B2 | High strip rate downstream chamber | Emerging Cross-Sectional Technologies | 358 | Active |
| US5279865A | High throughput interlevel dielectric gap filling process | Electricity | 336 | Expired |
| US6241845A | Apparatus for reducing process drift in inductive coupled plasma etching such as oxide layer | Electricity | 232 | Expired |
| US5451543A | Straight sidewall profile contact opening to underlying interconnect and method for making the same | Emerging Cross-Sectional Technologies | 100 | Expired |
| US6528427B2 | Methods for reducing contamination of semiconductor substrates | Emerging Cross-Sectional Technologies | 52 | Expired |
| US6048798A | Apparatus for reducing process drift in inductive coupled plasma etching such as oxide layer | Electricity | 33 | Expired |
| US7547635B2 | Process for etching dielectric films with improved resist and/or etch profile characteristics | Electricity | 15 | Expired |
| US6759336B1 | Methods for reducing contamination of semiconductor substrates | Emerging Cross-Sectional Technologies | 10 | Expired |
| US8173547B2 | Silicon etch with passivation using plasma enhanced oxidation | Electricity | 8 | Active |
| US7083903B2 | Methods of etching photoresist on substrates | Physics | 8 | Expired |
| US8598037B2 | Silicon etch with passivation using plasma enhanced oxidation | Electricity | 7 | Active |
| US8043434B2 | Method and apparatus for removing photoresist | Electricity | 6 | Active |
| US9330926B2 | Fabrication of a silicon structure and deep silicon etch with profile control | Electricity | 4 | Active |
| US9865472B2 | Fabrication of a silicon structure and deep silicon etch with profile control | Electricity | 3 | Active |
| US7824519B2 | Variable volume plasma processing chamber and associated methods | Electricity | 3 | Active |
| US9018098B2 | Silicon etch with passivation using chemical vapor deposition | Electricity | 3 | Active |
| US9719931B2 | Surface enhanced raman spectroscopy resonator structures and methods of making same | Performing Operations; Transporting | 2 | Active |
| US7605063B2 | Photoresist stripping chamber and methods of etching photoresist on substrates | Electricity | 2 | Active |
| US9857307B2 | Elevated surface enhanced Raman spectroscopy resonator structures and method of making same | Physics | 1 | Active |
| US9673069B2 | High frequency filter for improved RF bias signal stability | Electricity | 1 | Active |
| US9318341B2 | Methods for etching a substrate | Performing Operations; Transporting | 1 | Active |
| US10037883B2 | Enhanced productivity for an etch system through polymer management | Electricity | 1 | Active |
| US8757178B2 | Method and apparatus for removing photoresist | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.