Ryosuke Watanabe
43Patents
16h-index
50Co-inventors
84Inventor score
Filing activity: Jan 16, 2001 → May 19, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8309961B2 | Semiconductor device, display device, and electronic appliance | Electricity | 161 | Active |
| US9123573B2 | Oxide semiconductor stacked film and semiconductor device | Electricity | 78 | Active |
| US8492758B2 | Oxide semiconductor film and semiconductor device | Electricity | 76 | Active |
| US7591863B2 | Laminating system, IC sheet, roll of IC sheet, and method for manufacturing IC chip | Emerging Cross-Sectional Technologies | 70 | Expired |
| US8890159B2 | Oxide semiconductor stacked film and semiconductor device | Electricity | 53 | Active |
| US8481377B2 | Method for manufacturing a semiconductor device with impurity doped oxide semiconductor | Electricity | 39 | Active |
| US9214563B2 | Oxide semiconductor film and semiconductor device | Electricity | 38 | Active |
| US8123896B2 | Laminating system | Emerging Cross-Sectional Technologies | 36 | Active |
| US9406808B2 | Semiconductor device, display device, and electronic appliance | Electricity | 31 | Active |
| US7495272B2 | Semiconductor device having photo sensor element and amplifier circuit | Electricity | 29 | Expired |
| US9935202B2 | Transistor and display device comprising oxide semiconductor layer | Electricity | 26 | Active |
| US9318617B2 | Method for manufacturing a semiconductor device | Electricity | 25 | Active |
| US9853167B2 | Oxide semiconductor film and semiconductor device | Electricity | 21 | Active |
| US7521383B2 | Manufacturing method of semiconductor device | Emerging Cross-Sectional Technologies | 20 | Active |
| US8698156B2 | Laminating system | Emerging Cross-Sectional Technologies | 19 | Active |
| US10418491B2 | Oxide semiconductor film and semiconductor device | Electricity | 17 | Active |
| US7928510B2 | Manufacturing method of semiconductor device | Electricity | 12 | Active |
| US9583570B2 | Oxide semiconductor stacked film and semiconductor device | Electricity | 11 | Active |
| US10115831B2 | Semiconductor device having an oxide semiconductor layer comprising a nanocrystal | Electricity | 10 | Active |
| US9595435B2 | Method for forming multilayer film including oxide semiconductor film and method for manufacturing semiconductor device | Electricity | 9 | Active |
| US7932126B2 | Semiconductor device and manufacturing method thereof | Electricity | 8 | Active |
| US9925937B2 | Vehicle front portion structure | Performing Operations; Transporting | 7 | Active |
| US9828032B2 | Vehicle front section structure | Performing Operations; Transporting | 7 | Active |
| US6526364B2 | Method and apparatus for measuring roundness | Performing Operations; Transporting | 6 | Expired |
| US8625085B2 | Defect evaluation method for semiconductor | Electricity | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.