Inventor · Hengshan, TW

Sunny Wu

24Patents
6h-index
36Co-inventors
69Inventor score

Filing activity: Oct 12, 1989 → Oct 2, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US5016849A Swivel mechanism for a monitor of a laptop computer Emerging Cross-Sectional Technologies 71 Expired
US7144297B2 Method and apparatus to enable accurate wafer prediction Physics 20 Expired
US8108060B2 System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture Emerging Cross-Sectional Technologies 15 Active
US8041451B2 Method for bin-based control Emerging Cross-Sectional Technologies 8 Active
US8295965B2 Semiconductor processing dispatch control Emerging Cross-Sectional Technologies 7 Active
US8205173B2 Physical failure analysis guiding methods Physics 6 Active
US8082055B2 Method for a bin ratio forecast at new tape out stage Physics 5 Active
US7083495B2 Advanced process control approach for Cu interconnect wiring sheet resistance control Electricity 5 Expired
US6843264B2 Multi-phase pressure control valve for process chamber Emerging Cross-Sectional Technologies 4 Expired
US8452439B2 Device performance parmeter tuning method and system Physics 3 Active
US8606387B2 Adaptive and automatic determination of system parameters Emerging Cross-Sectional Technologies 3 Active
US9158301B2 Semiconductor processing dispatch control Emerging Cross-Sectional Technologies 3 Active
US9349660B2 Integrated circuit manufacturing tool condition monitoring system and method Emerging Cross-Sectional Technologies 2 Active
US9519285B2 Systems and associated methods for tuning processing tools Physics 2 Active
USD328289S Laptop computer General 1 Expired
US8685759B2 E-chuck with automated clamped force adjustment and calibration Emerging Cross-Sectional Technologies 1 Active
US8781614B2 Semiconductor processing dispatch control Emerging Cross-Sectional Technologies 1 Active
US9141097B2 Adaptive and automatic determination of system parameters Emerging Cross-Sectional Technologies 1 Active
US8219341B2 System and method for implementing wafer acceptance test (“WAT”) advanced process control (“APC”) with routing model Electricity 1 Active
US7851233B2 E-chuck for automated clamped force adjustment and calibration Emerging Cross-Sectional Technologies 0 Active
US10047439B2 Method and system for tool condition monitoring based on a simulated inline measurement Electricity 0 Active
US9698065B2 Real-time calibration for wafer processing chamber lamp modules Electricity 0 Active
US9159597B2 Real-time calibration for wafer processing chamber lamp modules Electricity 0 Active
US7354623B2 Surface modification of a porous organic material through the use of a supercritical fluid Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.