Tadashi Mitsui
44Patents
13h-index
30Co-inventors
81Inventor score
Filing activity: Jun 22, 1979 → Jul 27, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5049029A | Handling apparatus for transferring a semiconductor wafer or LCD | Emerging Cross-Sectional Technologies | 398 | Expired |
| US4424504A | Ferrite core | Electricity | 44 | Expired |
| US5702567A | Plurality of photolithographic alignment marks with shape, size and spacing based on circuit pattern features | Emerging Cross-Sectional Technologies | 41 | Expired |
| US4939494A | Surface-mounted-type inductance element | Electricity | 30 | Expired |
| US4760366A | Ferrite core | Electricity | 26 | Expired |
| US5611942A | Method for producing tips for atomic force microscopes | Emerging Cross-Sectional Technologies | 26 | Expired |
| US4549158A | Inductance element | Electricity | 25 | Expired |
| US4352080A | Ferrite core | Electricity | 22 | Expired |
| US5691540A | Assembly for measuring a trench depth parameter of a workpiece | Physics | 21 | Expired |
| US5917205A | Photolithographic alignment marks based on circuit pattern feature | Emerging Cross-Sectional Technologies | 20 | Expired |
| US5491339A | Charged particle detection device and charged particle radiation apparatus | Electricity | 19 | Expired |
| USD280810S | Ferrite core | General | 19 | Expired |
| US6278114A | Method and apparatus for measuring dimensions of a feature of a specimen | Electricity | 15 | Expired |
| USD334913S | Bobbin for use with a magnetic core | General | 12 | Expired |
| USD264959S | Transformer core member | General | 9 | Expired |
| USD385848S | Bobbin and magnetic core assembly | General | 8 | Expired |
| US8532395B2 | Pattern inspection method and semiconductor device manufacturing method | Physics | 7 | Active |
| US7668373B2 | Pattern evaluation method, method of manufacturing semiconductor, program and pattern evaluation apparatus | Physics | 6 | Active |
| US6985626B2 | Pattern evaluation method, pattern evaluation system and computer-readable recorded medium | Physics | 5 | Expired |
| US7151855B2 | Pattern measurement method, manufacturing method of semiconductor device, pattern measurement apparatus, and program | Physics | 4 | Expired |
| US7526408B2 | Measurement system and method and computer program for processing measurement data | Electricity | 3 | Expired |
| US7274820B2 | Pattern evaluation system, pattern evaluation method and program | Physics | 3 | Expired |
| US7702157B2 | Pattern evaluation method, pattern matching method and computer readable medium | Physics | 3 | Active |
| US8041105B2 | Pattern evaluation method, computer-readable medium, and semiconductor device manufacturing method | Physics | 2 | Active |
| US8144338B2 | Pattern measurement apparatus and pattern measurement method | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.