Takeo Ushiki
19Patents
9h-index
9Co-inventors
61Inventor score
Filing activity: May 13, 1998 → Oct 9, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6255731A | SOI bonding structure | Electricity | 111 | Expired |
| US6768324B1 | Semiconductor device tester which measures information related to a structure of a sample in a depth direction | Electricity | 97 | Expired |
| US6683308B2 | Method and apparatus for measuring thickness of thin film | Electricity | 45 | Expired |
| US6559662B1 | Semiconductor device tester and semiconductor device test method | Physics | 25 | Expired |
| US6614244B2 | Semiconductor device inspecting apparatus | Physics | 18 | Expired |
| US6258244A | Treating method and apparatus utilizing chemical reaction | Electricity | 14 | Expired |
| US7385195B2 | Semiconductor device tester | Electricity | 13 | Expired |
| US6946857B2 | Semiconductor device tester | Electricity | 12 | Expired |
| US6975125B2 | Semiconductor device tester | Electricity | 9 | Expired |
| US7321805B2 | Production managing system of semiconductor device | Electricity | 8 | Expired |
| US6850079B2 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Electricity | 7 | Expired |
| US6943043B2 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Electricity | 4 | Expired |
| US6711453B2 | Production managing system of semiconductor device | Electricity | 4 | Expired |
| US6842663B2 | Production managing system of semiconductor device | Electricity | 2 | Expired |
| US7002361B2 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Electricity | 2 | Expired |
| US6753194B2 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Electricity | 2 | Expired |
| US6837936B2 | Semiconductor manufacturing device | Physics | 1 | Expired |
| US7795593B2 | Surface contamination analyzer for semiconductor wafers | Electricity | 0 | Active |
| US7700380B2 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.