Inventor · Taoyuan, TW

Yu-Chieh Liao

22Patents

3h-index

21Co-inventors

59Inventor score

Filing activity: Jul 11, 2008 → Apr 11, 2022

Most-cited inventions

Patent	Title	Area	Cited by	Status
US7997841B2	Electronic device and fixture for same	Electricity	11	Active
US9607881B2	Insulator void aspect ratio tuning by selective deposition	Electricity	10	Active
US7866538B2	Container box	Performing Operations; Transporting	7	Active
US9576896B2	Semiconductor arrangement and formation thereof	Electricity	2	Active
US11004740B2	Structure and method for interconnection with self-alignment	Electricity	2	Active
US9583434B2	Metal line structure and method	Electricity	2	Active
US7765710B2	Apparatus and method for measuring diameter of hole	Physics	1	Active
US9564396B2	Semiconductor device and process	Electricity	1	Active
US11257673B2	Dual spacer metal patterning	Electricity	0	Active
US12051646B2	Metal line structure and method	Electricity	0	Active
US11640924B2	Structure and method for interconnection with self-alignment	Electricity	0	Active
US10763337B2	Fabrication of gate all around device	Electricity	0	Active
US9837307B2	Semiconductor device and process	Electricity	0	Active
US10002826B2	Semiconductor device structure with conductive pillar and conductive line and method for forming the same	Electricity	0	Active
US11101216B2	Metal line structure and method	Electricity	0	Active
US10867906B2	Conductive structures in semiconductor devices	Electricity	0	Active
US12094946B2	Gate all around device	Electricity	0	Active
US9349690B2	Semiconductor arrangement and formation thereof	Electricity	0	Active
US10490500B2	Metal line structure and method	Electricity	0	Active
US12094816B2	Semiconductor structure having deep metal line and method for forming the semiconductor structure	Electricity	0	Active
US11302792B2	Fabrication of gate all around device	Electricity	0	Active
US10325993B2	Gate all around device and fabrication thereof	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.