An-Chun Tu
16Patents
5h-index
14Co-inventors
59Inventor score
Filing activity: Nov 13, 1998 → Dec 31, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8247262B2 | Method for reducing contact resistance of CMOS image sensor | Electricity | 63 | Active |
| US6309957A | Method of low-K/copper dual damascene | Electricity | 35 | Expired |
| US6849546B1 | Method for improving interlevel dielectric gap filling over semiconductor structures having high aspect ratios | Electricity | 20 | Expired |
| US8586404B2 | Method for reducing contact resistance of CMOS image sensor | Electricity | 13 | Active |
| US8674469B2 | Isolation structure for backside illuminated image sensor | Electricity | 5 | Active |
| US8704224B2 | Semiconductor test structures | Electricity | 4 | Active |
| US8614131B2 | Self-aligned static random access memory (SRAM) on metal gate | Electricity | 3 | Active |
| US6828246B2 | Gas delivering device | Electricity | 2 | Expired |
| US7119017B2 | Method for improving interlevel dielectric gap filling over semiconductor structures having high aspect ratios | Mechanical Engineering; Lighting; Heating | 1 | Expired |
| US9250286B2 | Semiconductor test structures | Electricity | 1 | Active |
| US6030456A | Installation to supply gas | Electricity | 1 | Expired |
| US8946847B2 | Backside illuminated image sensors and method of making the same | Electricity | 0 | Active |
| US8352062B2 | Advanced process control for gate profile control | Electricity | 0 | Active |
| US9377503B2 | Semiconductor test structures | Electricity | 0 | Active |
| US9330901B2 | Nitrogen-containing oxide film and method of forming the same | Electricity | 0 | Active |
| US9257326B2 | Method of making backside illuminated image sensors | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.