Bradley Marc Davis
14Patents
5h-index
19Co-inventors
59Inventor score
Filing activity: Feb 25, 1998 → Jan 7, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6492281B1 | Method of fabricating conductor structures with metal comb bridging avoidance | Electricity | 35 | Expired |
| US6469518B1 | Method and apparatus for determining measurement frequency based on hardware age and usage | Electricity | 15 | Expired |
| US6684122B1 | Control mechanism for matching process parameters in a multi-chamber process tool | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6022749A | Using a superlattice to determine the temperature of a semiconductor fabrication process | Electricity | 7 | Expired |
| US8652907B2 | Integrating transistors with different poly-silicon heights on the same die | Electricity | 6 | Active |
| US6512991B1 | Method and apparatus for reducing deposition variation by modeling post-clean chamber performance | Physics | 5 | Expired |
| US6403151B1 | Method for controlling optical properties of antireflective coatings | Chemistry; Metallurgy | 3 | Expired |
| US6257760A | Using a superlattice to determine the temperature of a semiconductor fabrication process | Electricity | 2 | Expired |
| US8809206B2 | Patterned dummy wafers loading in batch type CVD | Electricity | 2 | Active |
| US8067314B2 | Gate trim process using either wet etch or dry etch approach to target CD for selected transistors | Electricity | 2 | Active |
| US7553727B2 | Using implanted poly-1 to improve charging protection in dual-poly process | Electricity | 1 | Active |
| US9196624B2 | Leakage reducing writeline charge protection circuit | Electricity | 0 | Active |
| US9431503B2 | Integrating transistors with different poly-silicon heights on the same die | Electricity | 0 | Active |
| US8409994B2 | Gate trim process using either wet etch or dry etch approach to target CD for selected transistors | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.