Inventor · San Jose, CA, US

Brian Duffy

32Patents
8h-index
83Co-inventors
78Inventor score

Filing activity: May 5, 1997 → Mar 29, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US8126255B2 Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Physics 146 Active
US9222895B2 Generalized virtual inspector Physics 78 Active
US7877722B2 Systems and methods for creating inspection recipes Physics 61 Active
US5865538A Containerized batch mixer Performing Operations; Transporting 33 Expired
US8041106B2 Methods and systems for detecting defects on a reticle Physics 32 Active
US8194968B2 Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions Physics 25 Active
US9816939B2 Virtual inspection systems with multiple modes Electricity 21 Active
US9601393B2 Selecting one or more parameters for inspection of a wafer Electricity 11 Active
US9916965B2 Hybrid inspectors Electricity 8 Active
US9183624B2 Detecting defects on a wafer with run time use of design data Physics 8 Active
US9262821B2 Inspection recipe setup from reference image variation Physics 7 Active
US10416088B2 Virtual inspection systems with multiple modes Electricity 5 Active
US10699926B2 Identifying nuisances and defects of interest in defects detected on a wafer Physics 4 Active
US10832396B2 And noise based care areas Physics 4 Active
US10267746B2 Automated pattern fidelity measurement plan generation Physics 4 Active
US10127653B2 Determining coordinates for an area of interest on a specimen Electricity 4 Active
US8537349B2 Monitoring of time-varying defect classification performance Emerging Cross-Sectional Technologies 4 Active
US10359371B2 Determining one or more characteristics of a pattern of interest on a specimen Electricity 3 Active
US11415526B2 Multi-controller inspection system Physics 3 Active
US10713769B2 Active learning for defect classifier training Physics 2 Active
US10496781B2 Metrology recipe generation using predicted metrology images Physics 2 Active
US11580375B2 Accelerated training of a machine learning based model for semiconductor applications Physics 2 Active
US10276346B1 Particle beam inspector with independently-controllable beams Electricity 2 Active
US10539612B2 Voltage contrast based fault and defect inference in logic chips Physics 2 Active
US6780656B2 Correction of overlay offset between inspection layers Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.