Inventor · Suwon-si, KR

Chi-Wook Kim

28Patents

8h-index

32Co-inventors

71Inventor score

Filing activity: Apr 30, 1998 → Aug 9, 2016

Most-cited inventions

Patent	Title	Area	Cited by	Status
US6526473B1	Memory module system for controlling data input and output by connecting selected memory modules to a data line	Physics	103	Expired
US6525988B2	Clock generating circuits controlling activation of a delay locked loop circuit on transition to a standby mode of a semiconductor memory device and methods for operating the same	Electricity	64	Expired
US6324119A	Data input circuit of semiconductor memory device	Physics	48	Expired
US6087851A	Method and apparatus for configuring a semiconductor device for compatibility with multiple logic interfaces	Electricity	11	Expired
US7161823B2	Semiconductor memory device and method of arranging signal and power lines thereof	Physics	11	Expired
US6795372B2	Bit line sense amplifier driving control circuits and methods for synchronous drams that selectively supply and suspend supply of operating voltages	Physics	10	Expired
US7038972B2	Double data rate synchronous dynamic random access memory semiconductor device	Physics	9	Expired
US6898139B2	Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate in a test mode of operation	Physics	9	Expired
US6236619A	Synchronous dynamic random access memory semiconductor device having write-interrupt-write function	Physics	6	Expired
US7057446B2	Reference voltage generating circuit and internal voltage generating circuit for controlling internal voltage level	Physics	5	Expired
US7084684B2	Delay stage insensitive to operating voltage and delay circuit including the same	Electricity	5	Expired
US7184347B2	Semiconductor memory devices having separate read and write global data lines	Physics	5	Expired
US7317645B2	Redundancy repair circuit and a redundancy repair method therefor	Physics	3	Expired
US7110316B2	Shared decoupling capacitance	Physics	3	Expired
US9824946B2	Test architecture of semiconductor device, test system, and method of testing semicondurctor devices at wafer level	Electricity	2	Active
US7336518B2	Layout for equalizer and data line sense amplifier employed in a high speed memory device	Physics	2	Expired
US7068083B2	Synchronous output buffer, synchronous memory device and method of testing access time	Physics	2	Expired
US7298199B2	Substrate bias voltage generating circuit for use in a semiconductor memory device	Physics	2	Expired
US7355901B2	Synchronous output buffer, synchronous memory device and method of testing access time	Physics	2	Expired
US7495472B2	Circuits/methods for electrically isolating fuses in integrated circuits	Physics	2	Active
US7525858B2	Semiconductor memory device having local sense amplifier	Physics	2	Active
US6229756A	Semiconductor memory device capable of preventing mis-operation due to load of column address line	Physics	1	Expired
US6777987B2	Signal buffer for high-speed signal transmission and signal line driving circuit including the same	Electricity	1	Expired
US7075849B2	Semiconductor memory device and layout method thereof	Physics	1	Expired
US7352646B2	Semiconductor memory device and method of arranging a decoupling capacitor thereof	Physics	1	Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.