Edward B. Eichelberger
18Patents
11h-index
21Co-inventors
72Inventor score
Filing activity: Dec 20, 1974 → Mar 3, 1994
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4801870A | Weighted random pattern testing apparatus and method | Physics | 118 | Expired |
| US4687988A | Weighted random pattern testing apparatus and method | Physics | 101 | Expired |
| US3961252A | Testing embedded arrays | Physics | 52 | Expired |
| US4745355A | Weighted random pattern testing apparatus and method | Physics | 48 | Expired |
| US4063080A | Method of propagation delay testing a level sensitive array logic system | Electricity | 39 | Expired |
| US4051352A | Level sensitive embedded array logic system | Electricity | 33 | Expired |
| US4074851A | Method of level sensitive testing a functional logic system with embedded array | Electricity | 28 | Expired |
| US4006492A | High density semiconductor chip organization | Emerging Cross-Sectional Technologies | 20 | Expired |
| US4071902A | Reduced overhead for clock testing in a level system scan design (LSSD) system | Physics | 19 | Expired |
| US4760289A | Two-level differential cascode current switch masterslice | Electricity | 15 | Expired |
| US4063078A | Clock generation network for level sensitive logic system | Electricity | 14 | Expired |
| US4546473A | Random pattern self test design | Electricity | 8 | Expired |
| US5389832A | Capacitively cross-coupled DCS emitter-follower output stage | Electricity | 6 | Expired |
| US3986057A | High performance latch circuit | Electricity | 3 | Expired |
| US5852367A | Speed enhanced level shifting circuit utilizing diode capacitance | Electricity | 2 | Expired |
| US5396182A | Low signal margin detect circuit | Physics | 2 | Expired |
| US5124591A | Low power push pull driver | Electricity | 2 | Expired |
| US5274285A | Enhanced differential current switch compensating upshift circuit | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.