Eugene Atwood
20Patents
8h-index
27Co-inventors
75Inventor score
Filing activity: Jul 22, 1996 → Sep 28, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5790384A | Bare die multiple dies for direct attach | Electricity | 130 | Expired |
| US6281573A | Thermal enhancement approach using solder compositions in the liquid state | Electricity | 76 | Expired |
| US5818984A | Optoelectronic interconnection of integrated circuits | Electricity | 72 | Expired |
| US6212070A | Zero force heat sink | Electricity | 62 | Expired |
| US6656770B2 | Thermal enhancement approach using solder compositions in the liquid state | Electricity | 38 | Expired |
| US6147506A | Wafer test fixture using a biasing bladder and methodology | Physics | 31 | Expired |
| US5805430A | Zero force heat sink | Electricity | 16 | Expired |
| US9588177B1 | Optimizing generation of test configurations for built-in self-testing | Physics | 10 | Active |
| US9209948B2 | Testing a decision feedback equalizer (‘DFE’) | Electricity | 3 | Active |
| US9014254B2 | Testing a decision feedback equalizer (‘DFE’) | Electricity | 2 | Active |
| US7218128B2 | Method and apparatus for locating and testing a chip | Physics | 2 | Expired |
| US9335370B2 | On-chip test for integrated AC coupling capacitors | Physics | 1 | Active |
| US8405419B1 | Digital test system and method for value based data | Electricity | 1 | Active |
| US9041572B1 | Testing a digital-to-analog converter | Electricity | 1 | Active |
| US12174251B2 | System testing using partitioned and controlled noise | Physics | 0 | Active |
| US11112457B2 | Dynamic weight selection process for logic built-in self test | Physics | 0 | Active |
| US11079406B2 | Semiconductor micro probe array having compliance | Physics | 0 | Active |
| US11041879B2 | Fluidized alignment of a semiconductor die to a test probe | Physics | 0 | Active |
| US12105834B2 | User privacy for autonomous vehicles | Performing Operations; Transporting | 0 | Active |
| US11079433B2 | Logic built-in self test dynamic weight selection method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.