Florian Bieck
15Patents
6h-index
5Co-inventors
55Inventor score
Filing activity: Aug 26, 2002 → Feb 28, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6894358B2 | Process for producing microelectromechanical components and a housed microelectromechanical component | Performing Operations; Transporting | 42 | Expired |
| US6911392B2 | Process for making contact with and housing integrated circuits | Electricity | 40 | Expired |
| US7285834B2 | Process for producing microelectromechanical components and a housed microelectromechanical component | Performing Operations; Transporting | 28 | Expired |
| US7160478B2 | Method for producing electronic componets | Electricity | 28 | Expired |
| US7071521B2 | Process for producing microelectromechanical components and a housed microelectromechanical component | Performing Operations; Transporting | 27 | Expired |
| US7700957B2 | Process for making contact with and housing integrated circuits | Electricity | 7 | Expired |
| US7825029B2 | Method for the production of structured layers on substrates | Electricity | 3 | Active |
| US7821106B2 | Process for making contact with and housing integrated circuits | Electricity | 2 | Active |
| US9245765B2 | Apparatus and method of applying a film to a semiconductor wafer and method of processing a semiconductor wafer | Emerging Cross-Sectional Technologies | 1 | Active |
| US8114304B2 | Method for producing electronic components | Electricity | 1 | Active |
| US9207276B2 | Method and apparatus for testing a semiconductor wafer | Physics | 1 | Active |
| US9063407B2 | Photolithography mask method for a wafer, method for producing same, and photolithography method for wafer using the same | Physics | 0 | Active |
| US9000512B1 | Packaging of electronic circuitry | Electricity | 0 | Active |
| US9076779B1 | Packaging of electronic circuitry | Electricity | 0 | Active |
| US9929018B2 | Semiconductor wafer and method for producing same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.